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Professional X-Ray Measurements of
nanoscale objects:

• thin films
• multilayer structures
• surfaces and interfaces
• pores and particles

Patented Analytical Methods:

• 2-wavelength reflectometry
• X-ray refractometry

Development of new methods of research surface layers and multilayered structures in a x-ray range (5-25 keV)

X-ray microscopy by means of digital CCD chambers
Are on sale - HOPG X-RAY MONOCHROMATORS
Select metod of forming and registration X-Rays or object, investigation with X-Rays
 !   News

We have received for a cycle of works on x-ray optics in magazine PTE - 1999-2001 Premium IAPC (MAIK Nauka/Interperiodica). The announcement of results of competition for 2001 "Search" (Poisk, Russia) # 25 from June, 21st 2002, p. 8, item 10.

Exp "Arkhimed"

Papers about us:

Pap. Russia, "Nezavisimaya gazeta - Nauka" 1.11.2001. "Ranbow in X-Rays"

Pap. Russia, "Izvestia" 29.03.2003 "Whot can not self Roentgen"

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