Thanks to using translucent monochromator (For more details see the reference) we have an opportunity to make measurements synchronously and at the same time without any changeover of the setting at least two x-radiation wave-lengths, for example alpha and beta of the same x-ray tube. That fact let avoid obstacles insuperable with standard (at the same wave) measurements. For example, inevitable mistakes and withdrawal from setting parameters during the process of measuring and at resetting for another wave-length, measuring of arbitrary form models (partly illuminated and partly intercepted beam). Ratio of reflection coefficients on (from, at) two waves is (calculated by means of measurements) don’t depend on these factors.
9s10=А.Г.Турьянский,
А.В.Виноградов, И.В.Пиршин.
"Двухволновой рентгеновский
рефлектометр".
Приборы и техника эксперимента, 1999, N 1, с.105-111, Москва.
8p04=А.Г.Турьянский,
А.В.Виноградов, И.В.Пиршин.
"Рентгеновский рефлектометр".
Патент РФ2104481,1998, МКИ G01B 15/08.
2t53=A.G. Touriyanski, I.V. Pirshin, N.L. Popov, YuA.
Uspenski, A.V. Vinogradov. Relative
X-Ray Reflectometry for Characterization of Nanostructures. Proceedings of the 5th ISTC Seminar Nanotechnologies in
the Area of Physics, Chemestry and Biotechnology.
9t22=А.В.Виноградов, И.В.Пиршин, А.Г.Турьянский, Р.М.Фещенко.
"Двухволновая и дифференциальная рентгеновская
рефлектометрия.
Принципы и применения".
Вторая национальная конференция по применению Рентгеновского, Синхротронного
излучений, Нейтронов и Электронов для исследования материалов (РСНЭ-99), Москва,
23-27 мая 1999г., с.166.
2t54=V.E. Asadchikov, V.S. Krivonosov, I.V. Kozhevnikov, I.V. Pirshin,
N.L. Popov, S.I. Sagitov, A.G. Tourjanski, Yu.A. Uspenski, A.V. Vinogradov. Hard X-ray reflectivity and scattering study of supersmooth surfaces and thin films in
Session 6.1. Invited.